Proceedings Annual reliability and maintainability symposium, Orlando, Florida USA, 1983 January 25-27

Proceedings Annual reliability and maintainability symposium, Orlando, Florida USA, 1983 January 25-27

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Inadequate testing causes higher field maintenance costs. o The design documentation contains a diagram depicting the overall Design ... of the following : Data Flow Diagrams Computational Flow Diagrams Control Flow Diagrams o Defines Systems Software Test Accesses ... The review shall be hosted by Systems Engineering, with Software Engineering and Software Quality Assurance in attendance.


Title:Proceedings Annual reliability and maintainability symposium, Orlando, Florida USA, 1983 January 25-27
Author: Institute of Electrical and Electronics Engineers, IEEE Reliability Society
Publisher: - 1983
ISBN-13:

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